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Introduction:

The increasing use of semiconductor devices in various electronic systems has also raised concerns about their susceptibility to electromagnetic radiation effects. Electromagnetic radiation can cause significant disruptions in the operation of semiconductor devices, leading to potential malfunctions or failures. Therefore, it is crucial to analyze the effects of electromagnetic radiation on semiconductor devices and develop effective mitigation strategies to enhance their reliability and performance.

Table of Contents:

Chapter 1: Introduction
1.1 Introduction
1.2 Objective of Study
1.3 Limitation of Study
1.4 Scope of Study

Chapter 2: Literature Review
2.1 Overview of Semiconductor Devices
2.2 Electromagnetic Radiation Effects on Semiconductor Devices
2.3 Existing Mitigation Strategies

Chapter 3: System Design and Methodology
3.1 System Design for Analysis of Electromagnetic Radiation Effects
3.2 Methodology for Evaluating Semiconductor Device’s Susceptibility
3.3 Mitigation Techniques Development

Chapter 4: System Implementation
4.1 Implementation of Analysis System
4.2 Evaluation of Semiconductor Devices
4.3 Implementation of Mitigation Techniques

Chapter 5: Conclusion and Summary
5.1 Summary of Findings
5.2 Conclusion
5.3 Recommendations for Future Research

Thesis Overview:

The thesis on “Analysis and mitigation of electromagnetic radiation effects on semiconductor devices” aims to investigate the impact of electromagnetic radiation on semiconductor devices and develop effective mitigation strategies to enhance their reliability. The study will begin with an introduction to the topic, highlighting the importance of the research and its objectives. The literature review will provide a comprehensive overview of semiconductor devices, electromagnetic radiation effects, and existing mitigation strategies.

The system design and methodology chapter will outline the design of the analysis system, methodology for evaluating semiconductor devices’ susceptibility to electromagnetic radiation, and the development of mitigation techniques. The system implementation chapter will detail the implementation of the analysis system, evaluation of semiconductor devices, and implementation of mitigation techniques.

In the conclusion and summary chapter, the findings of the study will be summarized, conclusions drawn, and recommendations for future research will be provided. Through this thesis, a better understanding of the effects of electromagnetic radiation on semiconductor devices and practical strategies for mitigating these effects will be achieved, contributing to the enhancement of semiconductor device reliability and performance.

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